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電子工程英中對照名詞等資訊。
| 英文名稱 | 中文名稱 | |
|---|---|---|
| 62344650 | semiconductor counters | 半導體計數器 |
| 62344651 | semiconductor defects | 半導體缺陷 |
| 62344652 | semiconductor device bonding | 半導體元件黏接 |
| 62344653 | semiconductor device breakdown | 半導體元件擊穿 |
| 62344654 | semiconductor device design and fabrication | 半導體元件設計與製程 |
| 62344655 | semiconductor device doping | 半導體元件摻雜 |
| 62344656 | semiconductor device economics | 半導體元件經濟學 |
| 62344657 | semiconductor device fabrication | 半導體元件製程 |
| 62344658 | semiconductor device ion implantation | 半導體元件離子植入法 |
| 62344659 | semiconductor device manufacture | 半導體元件製造 |
| 62344660 | semiconductor device manufacturing | 半導體元件製造 |
| 62344661 | semiconductor device matching | 半導體元件匹配 |
| 62344662 | semiconductor device measurements | 半導體元件量測 |
| 62344663 | semiconductor device mechanical factors | 半導體元件機械因子 |
| 62344664 | semiconductor device models | 半導體元件模型 |
| 62344665 | semiconductor device noise | 半導體元件雜訊 |
| 62344666 | semiconductor device packaging | 半導體元件封裝 |
| 62344667 | semiconductor device radiation effects/protection | 半導體元件輻射效應/保護 |
| 62344668 | semiconductor device reliability | 半導體元件可靠度 |
| 62344669 | semiconductor device reliability testing | 半導體元件可靠度測試 |
| 62344670 | semiconductor device testing | 半導體元件測試 |
| 62344671 | semiconductor device thermal factors | 半導體元件熱因素 |
| 62344672 | semiconductor devices | 半導體元件 |
| 62344673 | semiconductor devise ion implantation | 半導體元件離子植入 |
| 62344674 | semiconductor diode | 半導體二極體 |
| 62344675 | semiconductor diode oscillators | 半導體二極體振盪器 |
| 62344676 | semiconductor diode switches | 半導體二極體開關 |
| 62344677 | semiconductor distributed Bragg reflector (DBR) | 半導體分佈布拉格反射器 |
| 62344678 | semiconductor domains | 半導體領域 |
| 62344679 | semiconductor dopant extraction | 半導體摻雜劑萃取 |
| 62344680 | semiconductor doped glasses | 半導體摻雜玻璃 |
| 62344681 | Semiconductor doping | 半導體摻雜 |
| 62344682 | semiconductor epitaxial | 半導體晶膜 |
| 62344683 | semiconductor epitaxial dots | 半導體晶膜點 |
| 62344684 | semiconductor epitaxial growth | 半導體晶膜生長 |
| 62344685 | semiconductor epitaxial layers | 半導體晶膜層 |
| 62344686 | semiconductor equations | 半導體方程式 |
| 62344687 | semiconductor fabrication | 半導體製程 |
| 62344688 | semiconductor fabrication imperfections | 半導體製程不完全 |
| 62344689 | semiconductor fiber ring laser | 半導體光纖環雷射 |
| 62344690 | semiconductor films | 半導體膜 |
| 62344691 | semiconductor filter | 半導體濾波器 |
| 62344692 | semiconductor heterjunctions | 半導體異質接面 |
| 62344693 | semiconductor heterojunctions | 半導體異質接面 |
| 62344694 | semiconductor heterostructure junction | 半導體異質結構接面 |
| 62344695 | semiconductor heterostructures | 半導體異質結構 |
| 62344696 | semiconductor impurities | 半導體雜質 |
| 62344697 | semiconductor infrared detectors | 半導體紅外線偵測器 |
| 62344698 | semiconductor injection laser | 半導體注入雷射 |
| 62344699 | semiconductor integrated circuits | 半導體積體電路 |