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Title 環境鑑識技術開發研究(2/4)-IC、LC/MS/MS及 LC/Q-TOF鑑識技術開發與應用
Abstract 本研究計畫目標主要為開發IC、LC/MS/MS及LC/Q-TOF鑑識技術，與應用該鑑識技術在不同行業別污泥特性指標物之鑑識，並搭配XRF、XRD、SEM/EDX、GC/MS等快速篩選方法，建立污泥中有機、無機類化合物特殊化學成分分析技術及相關資料，和建置一套適用於國內污泥特性指標物之鑑識程序，作為後續污泥類鑑識技術開發之參考。 本研究依據計畫目標及工作內容規範在執行IC、LC/MS/MS及LC/Q-TOF鑑識技術開發部分，係參考國內外相關期刊論文應用IC-ICP/MS、LC/MS/MS及LC/Q-TOF在環境樣品、食品或個人衛生用藥等污染物檢測技術，並建立適用之樣品前處理及淨化方法與儀器分析條件和數據解析方法。本研究為開發及評估IC、LC/MS/MS及LC/Q-TOF鑑識技術應用在不同行業別污泥特性指標物鑑識之可行性評估與確認，在本計畫中是選擇以太陽能、印刷電路板或被動電子元件產業污泥為示範的對象，並搭配XRF、XRD、SEM/EDX、GC/MS等快速篩選方法，建立太陽能、印刷電路板或被動電子元件產業污泥中有機、無機類特性指標物，及建置適用於國內污泥特性指標物之鑑識程序。綜合上述鑑識方法所得到的檢測結果彙整評析後，得到初步太陽能、印刷電路板及被動電子元件產業污泥特性指標物如下：1.太陽能產業污泥特性指標物： XRF：矽、鈣 EDX：氟 XRD：CaF2、SiC晶相 GC/MS：9-十八碳烯酸胺(9-Octadecenamide, (Z)-) LC/Q-TOF：m/z=282.221 C18H36NO (9-十八碳烯酸胺)2.印刷電路板產業污泥特性指標物： XRF：銅、鎳、錳、錫 GC/MS：9-十八碳烯酸胺、1,2,5-Thiadiazole、Ethanol, 2-(2-ethoxyethoxy)-(EO介面活性劑)和Benzenamine、Benzenesulfonamide, 4-methyl-等amide類化合物。 LC/Q-TOF：m/z=256.263 C16H34NO、m/z=278.211 C17H28NO2、m/z=264.196 C16H26NO2、m/z=358.266 C24H28N3、m/z=372.244 C25H30N3、EO、PO等化合物。3.被動電子元件產業污泥特性指標物： XRF：鈦、鋇、鋯 XRD：BaTiO3晶相 GC/MS：9-十八碳烯酸胺、1,2,5-Thiadiazole、Ethanol, 2-(2-ethoxyethoxy)-(EO介面活性劑)和Di-n-octyl phthalate、Bis(2-ethylhexyl) phthalate等塑化劑。 LC/Q-TOF：m/z=331.100 C21H16ClN2、m/z=600~900 NPnEO、m/z=304.300 C21H38N、m/z=332.232 C23H42N、m/z=360.363 C25H46N、m/z=425.289 C19H41N2O8、m/z=391.285 C24H39O4(Bis(2-ethylhexyl) phthalateDEHP塑化劑)。
EngTitle Study of Environmental Forensic Technology Development (2/4)-IC, LC/MS/MS and LC/Q-TOF Forensic Tech
EngAbstract The purpose of this study was to develop the IC、LC/MS/MS and LC/Q-TOF forensic technology for identification and characterization of sludge in variety of industry. With the combination of XRF, XRD, SEM/EDX and GC/MS quick screening approaches, this study developed novel analysis approaches to identify compositions of organic and/or inorganic compound features in industrial sludge. In the meantime, this study collected the related information of industrial sludge to establish the sludge features index and identification procedures applying to our country.According to review the published literatures about the analysis approaches of IC、LC/MS/MS and LC/Q-TOF applying to the pollutants detection in environmental samples, food or personal care medicine etc., this study put the efforts on developing samples pretreatment and purification processes, optimizing analysis conditions, and data interpretation The sludge collected from solar industries, bare printed circuit boards manufacturing and electronic passive devices manufacturing were analyzed, and the composition of organic and/or inorganic compound features in sludge were used to establish the database. Based on the results of the above analyses, the sludge characteristics of solar energy manufacturing, bare printed circuit boards manufacturing and electronic passive devices manufacturing can be summarized as follows:1. Solar Energy manufacturing XRF：Silicon and Calcium EDX：Fluorine XRD：CaF2, and crystal of SiC  GC/MS： 9-Octadecenamide, (Z)- LC/Q-TOF：m/z=282.221, C18H36NO2. Bare printed circuit boards manufacturing XRF：Copper, Nickel, Manganese and Tin GC/MS：9-Octadecenamide, (Z)-, 1,2,5-Thiadiazole, Ethanol, 2-(2-ethoxyethoxy)-(EO surfactant), Benzenamine, Benzenesulfonamide, and amide compounds. LC/Q-TOF：m/z=256.263 C16H34NO, m/z=278.211 C17H28NO2, m/z=264.196 C16H26NO2, m/z=358.266 C24H28N3, m/z=372.244 C25H30N3, EO, PO etc. compounds.。3. Electronic passive devices manufacturing XRF：Titanium, Barium, and Zirconium XRD：crystal of BaTiO3 GC/MS：9-Octadecenamide, (Z)-、1,2,5-Thiadiazole、Ethanol, 2-(2-ethoxyethoxy)-(EO surfactant), Di-n-octyl phthalate、Bis(2-ethylhexyl) phthalate etc. DOPs. LC/Q-TOF：m/z=331.100 C21H16ClN2, m/z=600~900 NPnEO, m/z=304.300 C21H38N, m/z=332.232 C23H42N, m/z=360.363 C25H46N, m/z=425.289 C19H41N2O8, m/z=391.285 C24H39O4(Bis(2-ethylhexyl) phthalate (DEHP).
ProjectYear 103
SponsorOrg 環檢所
ExecutingOrg 工業技術研究院綠能與環境研究所
PublicFullVersionURL http://epq.epa.gov.tw/project/filedownload.aspx?fid=77911